SA Instrumentation & Control

The Official Journal of the SAIMC

TECHNEWS

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Issue Date: August 2010

3D mapping of surface levels

1 August 2010

The APM 3DLevelScanner is an innovative family of new devices that continuously measure level, volume and mass of materials inside a silo or open bin.
The 3DLevelScanner employs a 2-dimensional beam array-former to transmit low frequency pulses and to receive and record the pulse echoes from the surfaces of the contents in a silo, bin or other container. The device’s digital signal processor samples and analyses the received signals. From the estimated times of flight and directions of the echoes the processor generates a 3-dimensional ‘view’ of the surface, which can be displayed on a remote screen if required. This data is also used to determine the volume and mass of material under survey, to provide accurate process data in inventory control applications.
The 3DLevelScanner can measure the level, volume and mass of materials in situations that previous technology could not reach. It can survey practically any kind of material stored in a variety of containers, including silos, large open bins, bulk solid storage rooms and warehouses. The scanner allows users to monitor the characteristics of the surfaces that form randomly within material storage areas over time, for better inventory management and reporting.


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